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IEICE Trans

Fu-Ming TZU

Slit-Mura Detection through Non-contact Optical Measurements of In-Line Spectrometer for TFT-LCDs
Fu-Ming TZU Jung-Hua CHOU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/03/01
Vol. E92-C  No. 3  pp. 364-369
Type of Manuscript:  PAPER
Category: Electronic Displays
Keyword: 
TFT-LCD, slit Mura, spectrometer, thickness, chromaticity, 
 Summary | Full Text:PDF