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IEICE Trans

Francois DE DARAN

Immunity Modeling of Integrated Circuits: An Industrial Case
Frederic LAFON Francois DE DARAN Mohamed RAMDANI Richard PERDRIAU M'hamed DRISSI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/07/01
Vol. E93-B  No. 7  pp. 1723-1730
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto)
Category: Chip and Package Level EMC
Keyword: 
immunity, integrated circuit, EMC model, ICIM, black-box modeling, spice, 
 Summary | Full Text:PDF