Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2008/12/01
Vol. E91-C
No. 12
pp. 1894-1898
Type of Manuscript:
INVITED PAPER (Special Section on The Forefront of 21st Century Organic Molecular Electronics) Category: Keyword: field-effect transistors, gate oxide, bioelectronics, gate capacitance, gate leakage, |