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IEICE Trans

Chen SHI

Latch-Up Immune Bi-Direction ESD Protection Clamp for Push-Pull RF Power Amplifier
Yibo JIANG Hui BI Wei ZHAO Chen SHI Xiaolei WANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2020/04/01
Vol. E103-C  No. 4  pp. 194-196
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
electronic reliability, electrostatic discharge (ESD), bi-direction protection, push-pull amplifier, 
 Summary | Full Text:PDF