A New Method for the Determination of the Extrinsic Resistances of MESFETs and HEMTs from the Measured S-Parameters under Active Bias Jong-Sik LIMByung-Sung KIMSangwook NAM
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/03/01 Vol. E85-CNo. 3pp. 839-846 Type of Manuscript: PAPER Category: Microwaves, Millimeter-Waves Keyword: small signal model, extrinsic resistances, MESFET, HEMTs,