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IEICE Trans

Axel ERLEBACH

Simulation of RF Noise in MOSFETs Using Different Transport Models
Andreas SCHENK Bernhard SCHMITHUSEN Andreas WETTSTEIN Axel ERLEBACH Simon BRUGGER Fabian M. BUFLER Thomas FEUDEL Wolfgang FICHTNER 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C  No. 3  pp. 481-489
Type of Manuscript:  PAPER
Category: Device Modeling and Simulation
Keyword: 
device simulation, RF noise, impedance field method, Langevin equation, 
 Summary | Full Text:PDF