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IEICE Trans

Atsuo TAKATORI

A Statistical Quality Model for Delay Testing
Yasuo SATO Shuji HAMADA Toshiyuki MAEDA Atsuo TAKATORI Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3  pp. 349-355
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Signal Integrity and Variability
Keyword: 
delay testing, quality model, defect distribution, 
 Summary | Full Text:PDF