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IEICE Trans

Alfred KIK

Electromagnetic Scattering by a Cylindrical Material Piercing through the Narrow Walls of a Rectangular Waveguide: Analytical Solution and Application to Material Characterization
Alfred KIK Atsuhiro NISHIKATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2016/01/01
Vol. E99-C  No. 1  pp. 52-60
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application)
Category: 
Keyword: 
permittivity measurement, permeability measurement, rectangular waveguides, cylinders, inverse scattering, electromagnetic analysis, 
 Summary | Full Text:PDF
Analytical Solution for the Scattering by a Cylinder Perpendicular to the Narrow Walls inside a Rectangular Waveguide and Its Application to εr and μr Measurement
Alfred KIK Atsuhiro NISHIKATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2012/07/01
Vol. E95-C  No. 7  pp. 1211-1221
Type of Manuscript:  Special Section PAPER (Special Section on Recent Trends of Microwave Systems and Their Fundamental Technologies)
Category: 
Keyword: 
permittivity measurement, permeability measurement, rectangular waveguides, cylinders, scattering, electromagnetic analysis, 
 Summary | Full Text:PDF
A New Calibration Algorithm Using Reference Materials for the Waveguide-Penetration Method
Alfred KIK Atsuhiro NISHIKATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2011/09/01
Vol. E94-B  No. 9  pp. 2549-2557
Type of Manuscript:  PAPER
Category: Electromagnetic Compatibility(EMC)
Keyword: 
permittivity measurement, permeability measurement, waveguide, transmission-line method, vector network analyzer (VNA), calibration algorithm, reference material, error analysis, 
 Summary | Full Text:PDF
Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method
Alfred KIK Atsuhiro NISHIKATA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2010/07/01
Vol. E93-B  No. 7  pp. 1697-1706
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Electromagnetic Compatibility Technology in Conjunction with Main Topics of EMC'09/Kyoto)
Category: EMC Measurement Technique, EMC Test Facilities
Keyword: 
permittivity measurement, waveguide method, measurement errors, error analysis, 
 Summary | Full Text:PDF