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IEICE Trans

Aibin YAN

Evaluation and Test of Production Defects in Hardened Latches Ruijun MA Stefan HOLST Xiaoqing WEN Aibin YAN Hui XU
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2022/05/01 Vol. E105-D No. 5 pp. 996-1009 Type of Manuscript: PAPER Category: Dependable Computing Keyword: soft-error, hardened latch, defect, scan test,
	Summary \| Full Text:PDF

A Region-Based Through-Silicon via Repair Method for Clustered Faults Tianming NI Huaguo LIANG Mu NIE Xiumin XU Aibin YAN Zhengfeng HUANG
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2017/12/01 Vol. E100-C No. 12 pp. 1108-1117 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: 3D ICs, yield enhancement, TSV redundancy, reparability, additional delay overhead,
	Summary \| Full Text:PDF

Highly Robust Double Node Upset Resilient Hardened Latch Design Huaguo LIANG Xin LI Zhengfeng HUANG Aibin YAN Xiumin XU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2017/05/01 Vol. E100-C No. 5 pp. 496-503 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: single event double node upset, single node upset, resilience, radiation hardened latch,
	Summary \| Full Text:PDF

A Self-Recoverable, Frequency-Aware and Cost-Effective Robust Latch Design for Nanoscale CMOS Technology Aibin YAN Huaguo LIANG Zhengfeng HUANG Cuiyun JIANG Maoxiang YI
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2015/12/01 Vol. E98-C No. 12 pp. 1171-1178 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: transient fault, single event upset, soft error, radiation hardening, circuit reliability,
	Summary \| Full Text:PDF