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IEICE Trans

Adi RAHWANTO

Relative Intensity Noise of DFB LD's with Near and Far End Reflections
Takeshi KAWAI Adi RAHWANTO Katsuya KITAJIMA Masakazu MORI Toshio GOTO Akira MIYAUCHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/12/25
Vol. E78-C  No. 12  pp. 1779-1786
Type of Manuscript:  PAPER
Category: Opto-Electronics
Keyword: 
near end reflection, far end reflection, RIN, optoelectronics, 
 Summary | Full Text:PDF