Selective Pseudo-Labeling Based Subspace Learning for Cross-Project Defect Prediction

Ying SUN  Xiao-Yuan JING  Fei WU  Yanfei SUN  

Publication:   IEICE TRANSACTIONS on Information and Systems
Publicized: 2020/06/10
DOI: 10.1587/transinf.2020EDL8034
Full Text: PDF(190.9KB)