A Fast Fabric Defect Detection Framework for Multi-layer Convolutional Neural Network Based on Histogram Back-projection

Guodong Sun  Zhen Zhou  Yuan Gao  Yun Xu  Liang Xu  Song Lin  

Publication:   IEICE TRANSACTIONS on Information and Systems
Publicized: 2019/08/26
DOI: 10.1587/transinf.2019EDP7092
Full Text: PDF(1.3MB)