Time Dependent Percolation Analysis of the Degradation of Coherent Tunneling in Ultra-thin CoFeB/MgO/CoFeB Magnetic Tunneling Junctions

Keiji Hosotani  Makoto Nagamine  Ryu Hasunuma  

Publication:   IEICE TRANSACTIONS on Electronics
Publicized: 2019/12/06
DOI: 10.1587/transele.2019ECP5014
Full Text: PDF(1.2MB)