Prediction of DC-AC Converter Efficiency Degradation due to Device Aging Using a Compact MOSFET-Aging Model

Kenshiro Sato  Dondee Navarro  Shinya Sekizaki  Yoshifumi Zoka  Naoto Yorino  Hans Jürgen Mattausch  Mitiko Miura-Mattausch  

Publication:   IEICE TRANSACTIONS on Electronics
Publicized: 2019/09/02
DOI: 10.1587/transele.2019ECP5010
Full Text: PDF(1.9MB)