Modeling of Transfer Impedance in Automotive BCI Test System with Closed-loop Method

Junesang Lee  Hosang Lee  Jungrae Ha  Minho Kim  Sangwon Yun  Yeongsik Kim  Wansoo Nah  

Publication:   IEICE TRANSACTIONS on Communications
Publicized: 2019/10/18
DOI: 10.1587/transcom.2019EBP3144
Type of Manuscript: PAPER
Full Text: PDF(1.4MB)