Development of Evaluation Techniques of Low-loss Materials in Microwave and Millimeter Wave Region and Its Application to Filter Designs

Yoshio KOBAYASHI  

Publication
C - Abstracts of IEICE TRANSACTIONS on Electronics (Japanese Edition)   Vol.J100-C   No.10   pp.400-408
Publication Date: 2017/10/01
Online ISSN: 1881-0217
Type of Manuscript: INVITED PAPER (Special Section on IEICE 100th-Anniversary Historical Review on Electronics for Communication)
Category: 
Keyword: 
microwave,  millimeter wave,  material measurement filter,  circuit design,  

Full Text(in Japanese): FreePDF(386.5KB)


Summary: 
Some resonance methods developed to evaluate the characteristics of low-loss materials are summarized historically; such as the dielectric resonator method to measure the complex permittivity of a dielectric rod sample and the surface resistance of conductor plates, the balanced type disk resonator method to measure the complex permittivity in the normal direction of a dielectric plate sample, the cavity resonator method to measure the complex permittivity in the tangential direction of a dielectric plate sample including the cutoff-waveguide method particularly in the millimeter wave region, and another cavity resonance method to measure a thin circular bar sample. These resonance methods have been applied to develop new materials and design electric circuits precisely.