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Development of Evaluation Techniques of Low-loss Materials in Microwave and Millimeter Wave Region and Its Application to Filter Designs
C - Abstracts of IEICE TRANSACTIONS on Electronics (Japanese Edition)
Publication Date: 2017/10/01
Online ISSN: 1881-0217
Type of Manuscript: INVITED PAPER (Special Section on IEICE 100th-Anniversary Historical Review on Electronics for Communication)
microwave, millimeter wave, material measurement filter, circuit design,
Full Text(in Japanese): FreePDF(386.5KB)
Some resonance methods developed to evaluate the characteristics of low-loss materials are summarized historically; such as the dielectric resonator method to measure the complex permittivity of a dielectric rod sample and the surface resistance of conductor plates, the balanced type disk resonator method to measure the complex permittivity in the normal direction of a dielectric plate sample, the cavity resonator method to measure the complex permittivity in the tangential direction of a dielectric plate sample including the cutoff-waveguide method particularly in the millimeter wave region, and another cavity resonance method to measure a thin circular bar sample. These resonance methods have been applied to develop new materials and design electric circuits precisely.