Power Supply Voltage Control for Eliminating Overkills and Underkills in Delay Fault Testing

Masahiro ISHIDA  Toru NAKURA  Takashi KUSAKA  Satoshi KOMATSU  Kunihiro ASADA  

IEICE TRANSACTIONS on Electronics   Vol.E99-C   No.10   pp.1219-1225
Publication Date: 2016/10/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E99.C.1219
Type of Manuscript: PAPER
Category: Semiconductor Materials and Devices
power integrity,  power supply voltage control,  overkills and underkills,  delay fault testing,  automatic test equipment,  

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This paper proposes a power supply voltage control technique, and demonstrates its effectiveness for eliminating the overkills and underkills due to the power supply characteristic difference between an automatic test equipment (ATE) and a practical operating environment of the DUT. The proposed method controls the static power supply voltage on the ATE system, so that the ATE can eliminate misjudges for the Pass or Fail of the DUT. The method for calculating the power supply voltage is also described. Experimental results show that the proposed method can eliminate 89% of overkills and underkills in delay fault testing with 105 real silicon devices. Limitations of the proposed method are also discussed.