Millimeter-Wave Ellipsometry Using Interface-Planarization Prism

Hiroshi YAMAMOTO  Hiroshi ITO  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E98-C   No.8   pp.873-877
Publication Date: 2015/08/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E98.C.873
Type of Manuscript: Special Section PAPER (Special Section on Microwave Photonics)
Category: MWP Sensing Technique
Keyword: 
ellipsometry,  millimeter wave,  UTC-PD,  biological tissue,  

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Summary: 
The use of an interface-planarization (IP) prism in millimeter-wave ellipsometry is proposed to achieve reproducible measurements of soft, protean, and non-flat samples. The complex relative dielectric constants of a slice of bovine tissue were successfully measured at frequencies from 90 to 140 GHz using the IP prism to confirm its applicability. The use of the IP prism was found to be advantageous for protecting the sample surface from the desiccation during the measurements.