Novel DEM Technique for Current-Steering DAC in 65-nm CMOS Technology

Yuan WANG
Wei SU
Guangliang GUO
Xing ZHANG

Publication
IEICE TRANSACTIONS on Electronics   Vol.E98-C    No.12    pp.1193-1195
Publication Date: 2015/12/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E98.C.1193
Type of Manuscript: BRIEF PAPER
Category: Electronic Circuits
Keyword: 
dynamic element matching (DEM),  current-steering digital-to-analog converter (DAC),  spurious free dynamic range (SFDR),  

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Summary: 
A novel dynamic element matching (DEM) method, called binary-tree random DEM (BTR-DEM), is presented for a Nyquist-rate current-steering digital-to-analog converter (DAC). By increasing or decreasing the number of unit current sources randomly at the same time, the BTR-DEM encoding reduces switch transition glitches. A 5-bit current-steering DAC with the BTR-DEM technique is implemented in a 65-nm CMOS technology. The measured spurious free dynamic range (SFDR) attains 42 dB for a sample rate of 100 MHz and shows little dependence on signal frequency.