Differential Reliability Path Accommodation Design and Reconfiguration in Virtualized Multi-Layer Transport Network

Akihiro KADOHATA
Takafumi TANAKA
Atsushi WATANABE
Akira HIRANO
Hiroshi HASEGAWA
Ken-ichi SATO

Publication
IEICE TRANSACTIONS on Communications   Vol.E98-B    No.11    pp.2151-2159
Publication Date: 2015/11/01
Online ISSN: 1745-1345
DOI: 10.1587/transcom.E98.B.2151
Type of Manuscript: Special Section PAPER (Special Section on Network Systems for Virtualized Environment)
Category: 
Keyword: 
multi-layer transport network,  network virtualization,  robustness and reconfiguration,  

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Summary: 
Multi-layer transport networks that utilize sub-lambda paths over a wavelength path have been shown to be effective in accommodating traffic with various levels of granularity. For different service requirements, a virtualized network was proposed where the infrastructure is virtually sliced to accommodate different levels of reliability. On the other hand, network reconfiguration is a promising candidate for quasi-dynamic and multi-granular traffic. Reconfiguration, however, incurs some risks such as service disruption and fluctuations in delay. There has not yet been any study on accommodating and reconfiguring paths according to different service classes in multi-layer transport networks. In this paper, we propose differentiated reconfiguration to address the trade-off relationship between accommodation efficiency and disruption risk in virtualized multi-layer transport networks that considers service classes defined as a combination of including or excluding a secondary path and allowing or not allowing reconfiguration. To implement the proposed network, we propose a multi-layer redundant path accommodation design and reconfiguration algorithm. A reliability evaluation algorithm is also introduced. Numerical evaluations show that when all classes are divided equally, equipment cost can be reduced approximately by 6%. The proposed reconfigurable networks are shown to be a cost effective solution that maintains reliability.