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Analysis of Radiation-Induced Clock-Perturbation in Phase-Locked Loop
SinNyoung KIM Akira TSUCHIYA Hidetoshi ONODERA
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2014/03/01
Online ISSN: 1745-1337
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuit Techniques and Related Topics)
radiation-hardened phase-locked loop (RH-PLL), soft error, clock-perturbation model,
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This paper presents an analysis of radiation-induced clock-perturbation in phase-locked loop (PLL). Due to a trade-off between cost, performance, and reliability, radiation hardened PLL design need robust strategy. Thus, evaluation of radiation vulnerability is important to choose the robust strategy. The conventional evaluation-method is however based on brute-force analysis — SPICE simulation and experiment. The presented analysis result eliminates the brute-force analysis in evaluation of the radiation vulnerability. A set of equations enables to predict the radiation-induced clock-perturbation at the every sub-circuits. From a demonstration, the most vulnerable nodes have been found, which are validated using a PLL fabricated with 0.18µm CMOS process.