A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing

Kohei MIYASE  Ryota SAKAI  Xiaoqing WEN  Masao ASO  Hiroshi FURUKAWA  Yuta YAMATO  Seiji KAJIHARA  

IEICE TRANSACTIONS on Information and Systems   Vol.E96-D   No.9   pp.2003-2011
Publication Date: 2013/09/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E96.D.2003
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing)
at-speed testing,  ATPG,  IR-drop,  test power reduction,  low power test,  

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Test power has become a critical issue, especially for low-power devices with deeply optimized functional power profiles. Particularly, excessive capture power in at-speed scan testing may cause timing failures that result in test-induced yield loss. This has made capture-safety checking mandatory for test vectors. However, previous capture-safety checking metrics suffer from inadequate accuracy since they ignore the time relations among different transitions caused by a test vector in a circuit. This paper presents a novel metric called the Transition-Time-Relation-based (TTR) metric which takes transition time relations into consideration in capture-safety checking. Detailed analysis done on an industrial circuit has demonstrated the advantages of the TTR metric. Capture-safety checking with the TTR metric greatly improves the accuracy of test vector sign-off and low-capture-power test generation.