On Detecting Delay Faults Using Time-to-Digital Converter Embedded in Boundary Scan

Takanobu NIMIYA

IEICE TRANSACTIONS on Information and Systems   Vol.E96-D    No.9    pp.1986-1993
Publication Date: 2013/09/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E96.D.1986
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing)
delay testing,  time-to-digital converter,  boundary scan,  design for testability,  

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This paper proposes a method for testing delay faults using a boundary scan circuit in which a time-to-digital converter (TDC) is embedded. The incoming transitions from the other cores or chips are captured at the boundary scan circuit. The TDC circuit is modified to set the initial value for a delay line through which the transition is propagated. The condition for measuring timing slacks of two or more paths is also investigated since the overlap of the signals may occur in the delay line of the TDC in our boundary scan circuit. An experimental IC with the TDC and boundary scan is fabricated and is measured to estimate the delay of some paths measured by the TDC embedded in boundary scan cells. The simulation results for a benchmark circuit with the boundary scan circuit are also shown for the case that timing slacks of multiple paths can be observed even if the signals overlap in the TDC.