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Field Slack Assessment for Predictive Fault Avoidance on Coarse-Grained Reconfigurable Devices
Toshihiro KAMEDA Hiroaki KONOURA Dawood ALNAJJAR Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/08/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Reconfigurable Systems)
Category: Test and Verification
field test, fault avoidance, coarse-grained reconfigurable device,
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This paper proposes a procedure for avoiding delay faults in field with slack assessment during standby time. The proposed procedure performs path delay testing and checks if the slack is larger than a threshold value using selectable delay embedded in basic elements (BE). If the slack is smaller than the threshold, a pair of BEs to be replaced, which maximizes the path slack, is identified. Experimental results with two application circuits mapped on a coarse-grained architecture show that for aging-induced delay degradation a small threshold slack, which is less than 1 ps in a test case, is enough to ensure the delay fault prediction.