A Novel Pattern Run-Length Coding Method for Test Data Compression

Diancheng WU  Yu LIU  Hao ZHU  Donghui WANG  Chengpeng HAO  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E96-C    No.9    pp.1201-1204
Publication Date: 2013/09/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E96.C.1201
Print ISSN: 0916-8516
Type of Manuscript: BRIEF PAPER
Category: Integrated Electronics
Keyword: 
Automatic Test Equipment,  test data compression,  pattern run-length coding,  X-assigning,  

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Summary: 
This paper presents a novel data compression method for testing integrated circuits within the framework of pattern run-length coding. The test set is firstly divided into 2n-length patterns where n is a natural number. Then the compatibility of each pattern, which can be an external type, or an internal type, is analyzed. At last, the codeword of each pattern is generated according to its analysis result. Experimental results for large ISCAS89 benchmarks show that the proposed method can obtain a higher compression ratio than existing ones.