Two-Tone Signal Generation for ADC Testing

Keisuke KATO  Fumitaka ABE  Kazuyuki WAKABAYASHI  Chuan GAO  Takafumi YAMADA  Haruo KOBAYASHI  Osamu KOBAYASHI  Kiichi NIITSU  

IEICE TRANSACTIONS on Electronics   Vol.E96-C    No.6    pp.850-858
Publication Date: 2013/06/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E96.C.850
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
ADC testing,  two-tone signal,  intermodulation distortion,  arbitrary waveform generator,  ΣΔ DAC,  digital pre-distortion,  distortion shaping,  

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This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.