For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
Two-Tone Signal Generation for ADC Testing
Keisuke KATO Fumitaka ABE Kazuyuki WAKABAYASHI Chuan GAO Takafumi YAMADA Haruo KOBAYASHI Osamu KOBAYASHI Kiichi NIITSU
IEICE TRANSACTIONS on Electronics
Publication Date: 2013/06/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
ADC testing, two-tone signal, intermodulation distortion, arbitrary waveform generator, ΣΔ DAC, digital pre-distortion, distortion shaping,
Full Text: PDF(5.2MB)>>
This paper describes algorithms for generating low intermodulation-distortion (IMD) two-tone sinewaves, for such as communication application ADC testing, using an arbitrary waveform generator (AWG) or a multi-bit ΣΔ DAC inside an SoC. The nonlinearity of the DAC generates distortion components, and we propose here eight methods to precompensate for the IMD using DSP algorithms and produce low-IMD two-tone signals. Theoretical analysis, simulation, and experimental results all demonstrate the effectiveness of our approach.