Mechanism of Increase in Inductance at Loosened Connector Contact Boundary

Kazuki MATSUDA  Yu-ichi HAYASHI  Takaaki MIZUKI  Hideaki SONE  

IEICE TRANSACTIONS on Electronics   Vol.E95-C   No.9   pp.1502-1507
Publication Date: 2012/09/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E95.C.1502
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices - Papers selected from International Session on Electro-Mechanical Devices 2011 (IS-EMD2011) and other recent research results -)
contact failure,  loose contact,  TDR,  inductance,  

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A loosened connector between interconnected electric devices causes an increase in electromagnetic radiation when the devices operate in high-frequency bands. To develop a high-frequency circuit equivalent to a connector with contact failure, we previously investigated the parasitic elements caused by failure at the contact boundary. From the results of that study, the inductance and resistance at a connection contact boundary are increased by the loosening of a connector. Furthermore, the increase in inductance is the dominant factor in increasing the intensity of the electromagnetic radiation. In this paper, to suppress electromagnetic radiation resulting from a loose contact, we formulate the contact performance requirement needed to maintain a good contact condition when a small loosening has occurred at the interconnection. To this end, we investigate the mechanism of increase in the inductance by loosening the connector.