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Recent Developments of High-Tc Electronic Devices with Multilayer Structures and Ramp-Edge Josephson Junctions
Seiji ADACHI Akira TSUKAMOTO Tsunehiro HATO Joji KAWANO Keiichi TANABE
IEICE TRANSACTIONS on Electronics
Publication Date: 2012/03/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: INVITED PAPER (Special Section on Josephson Junctions – Past 50 years and Future –)
high-Tc superconductor, Josephson junction, ramp-edge, SQUID,
Full Text: FreePDF
Recent developments of electronic devices containing Josephson junctions (JJ) with high-Tc superconductors (HTS) are reported. In particular, the fabrication process and the properties of superconducting quantum interference devices (SQUIDs) with a multilayer structure and ramp-edge-type JJs are described. The JJs were fabricated by recrystallization of an artificially deposited Cu-poor precursory layer. The formation mechanism of the junction barrier is discussed. We have fabricated various types of gradiometers and magnetometers. They have been actually utilized for several application systems, such as a non-destructive evaluation (NDE) system for deep-lying defects in a metallic plate and a reel-to-reel testing system for striated HTS-coated conductors.