High Frequency Ray-Mode Coupling Analysis of Plane Wave Diffraction by a Wide and Thick Slit on a Conducting Screen

Hiroshi SHIRAI  Ryoichi SATO  

IEICE TRANSACTIONS on Electronics   Vol.E95-C   No.1   pp.10-15
Publication Date: 2012/01/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E95.C.10
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application)
Category: Scattering and Diffraction
ray-mode coupling,  diffraction,  GTD,  thick slit,  

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Diffraction field by a wide and thick slit on a conducting screen has been analyzed. High frequency ray-mode coupling analysis has been utilized, and the total diffracted or radiated field in each region is considered as a summation of successive modal radiation contribution due to the original modal excitation by the incident plane wave. Our derived results are compared with those obtained by other solutions, and good agreement has been observed, and the validity of our formulation is confirmed.