A Millimeter-Wave Resistance Error Tolerant Termination in Multi-Layered LTCC Substrate

Takeshi YUASA
Yukihiro TAHARA
Naofumi YONEDA
Hideyuki OH-HASHI

IEICE TRANSACTIONS on Electronics   Vol.E94-C    No.3    pp.321-326
Publication Date: 2011/03/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E94.C.321
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Microwaves, Millimeter-Waves
multi-layered substrate,  LTCC,  termination,  resistive film,  manufacturing error,  resistance error,  

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A millimeter-wave termination which is tolerant to the resistance error of the embedded resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be accomplished using two bifurcated strip lines overlapping with the resistive film, whose lengths are different form each other. It has been experimentally demonstrated that the proposed termination configuration is effective to enhance the tolerance to resistance error of the embedded resistive film in the LTCC substrate.