Flexible Test Scheduling for an Asynchronous On-Chip Interconnect through Special Data Transfer

Tsuyoshi IWAGAKI  Eiri TAKEDA  Mineo KANEKO  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E94-A   No.12   pp.2563-2570
Publication Date: 2011/12/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E94.A.2563
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword: 
asynchronous on-chip interconnect,  CHAIN,  stuck-at fault,  test scheduling,  integer linear programming,  

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Summary: 
This paper proposes a test scheduling method for stuck-at faults in a CHAIN interconnect, which is an asynchronous on-chip interconnect architecture, with scan ability. Special data transfer which is permitted only during test, is exploited to realize a more flexible test schedule than that of a conventional approach. Integer linear programming (ILP) models considering such special data transfer are developed according to the types of modules under test in a CHAIN interconnect. The obtained models are processed by using an ILP solver. This framework can not only obtain optimal test schedules but also easily introduce additional constraints such as a test power budget. Experimental results using benchmark circuits show that the proposed method can reduce test application time compared to that achieved by the conventional method.