Novel Multiple-Valued Logic Design Using BiCMOS-Based Negative Differential Resistance Circuit Biased by Two Current Sources

Kwang-Jow GAN  Dong-Shong LIANG  Yan-Wun CHEN  

IEICE TRANSACTIONS on Information and Systems   Vol.E93-D   No.8   pp.2068-2072
Publication Date: 2010/08/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E93.D.2068
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Multiple-Valued Logic and VLSI Computing)
Category: Multiple-Valued VLSI Technology
multiple-valued logic,  negative differential resistance,   BiCMOS process,  

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The paper demonstrates a novel multiple-valued logic (MVL) design using a three-peak negative differential resistance (NDR) circuit, which is made of several Si-based metal-oxide-semiconductor field-effect-transistor (MOS) and SiGe-based heterojunction bipolar transistor (HBT) devices. Specifically, this three-peak NDR circuit is biased by two switch-controlled current sources. Compared to the traditional MVL circuit made of resonant tunneling diode (RTD), this multiple-peak MOS-HBT-NDR circuit has two major advantages. One is that the fabrication of this circuit can be fully implemented by the standard BiCMOS process without the need for molecular-beam epitaxy system. Another is that we can obtain more logic states than the RTD-based MVL design. In measuring, we can obtain eight logic states at the output according to a sequent control of two current sources on and off in order.