A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint

Ryoichi INOUE  Toshinori HOSOKAWA  Hideo FUJIWARA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E93-D   No.1   pp.24-32
Publication Date: 2010/01/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E93.D.24
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
Category: 
Keyword: 
state-observable FSMs,  logical fault testing,  timing fault testing,  fault sensitization coverage,  n-detection,  

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Summary: 
Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.