For Full-Text PDF, please login, if you are a member of IEICE,|
or go to Pay Per View on menu list, if you are a nonmember of IEICE.
A Fault Dependent Test Generation Method for State-Observable FSMs to Increase Defect Coverage under the Test Length Constraint
Ryoichi INOUE Toshinori HOSOKAWA Hideo FUJIWARA
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test, Diagnosis and Verification of SOCs)
state-observable FSMs, logical fault testing, timing fault testing, fault sensitization coverage, n-detection,
Full Text: PDF(2.1MB)>>
Since scan testing is not based on the function of the circuit, but rather the structure, it is considered to be both a form of over testing and under testing. Moreover, it is important to test VLSIs using the given function. Since the functional specifications are described explicitly in the FSMs, high test quality is expected by performing logical fault testing and timing fault testing. This paper proposes a fault-dependent test generation method to detect specified fault models completely and to increase defect coverage as much as possible under the test length constraint. We present experimental results for MCNC'91 benchmark circuits to evaluate bridging fault coverage, transition fault coverage, and statistical delay quality level and to show the effectiveness of the proposed test generation method compared with a stuck-at fault-dependent test generation method.