A Practical Threshold Test Generation for Error Tolerant Application

Hideyuki ICHIHARA  Kenta SUTOH  Yuki YOSHIKAWA  Tomoo INOUE  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E93-D   No.10   pp.2776-2782
Publication Date: 2010/10/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E93.D.2776
Print ISSN: 0916-8532
Type of Manuscript: PAPER
Category: Information Network
Keyword: 
acceptable fault,  test generation model,  error significance,  threshold testing and error tolerance,  

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Summary: 
Threshold testing, which is an LSI testing method based on the acceptability of faults, is effective in yield enhancement of LSIs and selective hardening for LSI systems. In this paper, we propose test generation models for threshold test generation. Using the proposed models, we can efficiently identify acceptable faults and generate test patterns for unacceptable faults with a general test generation algorithm, i.e., without a test generation algorithm specialized for threshold testing. Experimental results show that our approach is, in practice, effective.