Observation of Tin Plated Fretting Contacts Using FIB-SEM

Tetsuya ITO  Yoshiyuki NOMURA  Yasuhiro HATTORI  

IEICE TRANSACTIONS on Electronics   Vol.E93-C   No.9   pp.1452-1455
Publication Date: 2010/09/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E93.C.1452
Print ISSN: 0916-8516
Type of Manuscript: BRIEF PAPER
fretting,  FIB-SEM,  tin plating thickness,  

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In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.