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Observation of Tin Plated Fretting Contacts Using FIB-SEM
Tetsuya ITO Yoshiyuki NOMURA Yasuhiro HATTORI
IEICE TRANSACTIONS on Electronics
Publication Date: 2010/09/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: BRIEF PAPER
fretting, FIB-SEM, tin plating thickness,
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In this report, Focused Ion Beam (FIB) -- SEM technique was applied to observe the tin plated fretting contacts. Spatial distributions of tin, tin oxide and so on have been confirmed quantitatively in two plating thickness of 1 and 5 µm.