An Enhanced Dual-Path ΔΣ A/D Converter

Yoshio NISHIDA  Koichi HAMASHITA  Gabor C. TEMES  

IEICE TRANSACTIONS on Electronics   Vol.E93-C    No.6    pp.884-892
Publication Date: 2010/06/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E93.C.884
Print ISSN: 0916-8516
Type of Manuscript: PAPER
Category: Electronic Circuits
ADC,  delta-sigma modulation,  DWA,  switched-capacitor circuits,  CMOS,  

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This paper presents an enhanced dual-path delta-sigma analog-to-digital converter. Compared with other architectures, the enhanced architecture increases the noise shaping order without any instability problems and displays analog complexity equivalent to the multi-stage noise shaping architecture. Our delta-sigma converter is based on this new architecture. It employs not only doubly-differential structure to reduce common-mode errors in the system-level but also delayed-feed-in structure to mitigate the timing constraint of the feedback signal. Regarding the circuit implementation, the first-order enhancement of the quantization noise shaping is achieved via the use of a switched capacitor circuit technique. The circuit is incorporated into the active adder in a low-distortion structure. The supporting clock generation circuit that provides additional phases of clocks with the enhancement block is also implemented in the CMOS logic gates. A digital dynamic element matching circuit (i.e., segmented data-weighted-average circuit) is designed to reduce mismatch errors caused by the feedback DAC of modulator. A test chip, fabricated in a 0.18-µm CMOS process, provides a signal-to-noise+distortion ratio (SNDR) of 75-dB for a 1.0-MHz signal bandwidth clocked at 40-MHz. The 2nd harmonic is -101 dB and the 3rd harmonic is -94 dB when a -4.5-dB 100-kHz input signal is applied.