An Arbitrary Digital Power Noise Generator Using 65 nm CMOS Technology

Tetsuro MATSUNO  Daisuke FUJIMOTO  Daisuke KOSAKA  Naoyuki HAMANISHI  Ken TANABE  Masazumi SHIOCHI  Makoto NAGATA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E93-C   No.6   pp.820-826
Publication Date: 2010/06/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E93.C.820
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Analog Circuits and Related SoC Integration Technologies)
Category: 
Keyword: 
noise emulation,  substrate noise,  power supply noise,  signal integrity,  substrate coupling,  power integrity,  

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Summary: 
An arbitrary noise generator (ANG) is based on time-series charging of divided parasitic capacitance (TSDPC) and emulates power supply noise generation in a CMOS digital circuit. A prototype ANG incorporates an array of 32 x 32 6-bit TSDPC cells along with a 128-word vector memory and occupies 2 x 2 mm2 in a 65 nm 1.2 V CMOS technology. Digital noise emulation of functional logic cores such as register arrays is demonstrated with chip-level waveform monitoring at power supply, ground, as well as substrate nodes.