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An Estimation Method of Poynting Vector with Near-Magnetic-Field Measurement
Hiroshi HIRAYAMA Nobuyoshi KIKUMA Kunio SAKAKIBARA
IEICE TRANSACTIONS on Electronics
Publication Date: 2010/01/01
Online ISSN: 1745-1353
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application)
electro-magnetic interference, near-field measurement, shielded loop probe, poynting vector, yee cell,
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A new technique to estimate the Poynting vector distribution from near-magnetic-field measurement is proposed. To calculate the Poynting vector, both electric and magnetic field should be known. In the proposed method, only magnetic-field measurement of three orthogonal axes is required. Electric field is estimated from the measured magnetic field by using the Maxwell's equation. The modified Yee cell is employed to estimate electric field from the measured magnetic field. Finally, the Poynting vector is calculated from the measured magnetic field and the estimated electric field. Since the proposed method enables us to understand propagation direction of electro-magnetic energy, it can be utilized to locate an emission source and to investigate a mechanism of undesired emission. Experiments are carried out to discuss the accuracy and to validate practical usefulness.