Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures

Takashi IMAGAWA  Masayuki HIROMOTO  Hiroyuki OCHI  Takashi SATO  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E93-A   No.12   pp.2524-2532
Publication Date: 2010/12/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E93.A.2524
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword: 
soft error,  TMR,  reliability,  methodology,  

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Summary: 
This paper proposes a reliability evaluation environment for coarse-grained reconfigurable architectures. This environment is designed so that it can be easily extended to different target architectures and applications by automating the generation of the simulation inputs such as HDL codes for fault injection and configuration information. This automation enables us to explore a huge design space in order to efficiently analyze area/reliability trade-offs and find the best solution. This paper also shows demonstrative examples of the design space exploration of coarse-grained reconfigurable architectures using the proposed environment. Through the demonstrations, we discuss relationship between coarse-grained architectures and reliability, which has not yet been addressed in existing literatures and show the feasibility of the proposed environment.