Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution

Ryo HARADA  Yukio MITSUYAMA  Masanori HASHIMOTO  Takao ONOYE  

Publication
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E93-A   No.12   pp.2417-2423
Publication Date: 2010/12/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E93.A.2417
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
soft error,  single event transient (SET),  pulse width,  measurement circuit,  

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Summary: 
This paper presents two circuits to measure pulse width distribution of single event transients (SETs). We first review requirements for SET measurement in accelerated neutron radiation test and point out problems of previous works, in terms of time resolution, time/area efficiency for obtaining large samples and certainty in absolute values of pulse width. We then devise two measurement circuits and a pulse generator circuit that satisfy all the requirements and attain sub-FO1-inverter-delay resolution, and propose a measurement procedure for assuring the absolute width values. Operation of one of the proposed circuits was confirmed by a radiation experiment of alpha particles with a fabricated test chip.