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Measurement Circuits for Acquiring SET Pulse Width Distribution with Sub-FO1-Inverter-Delay Resolution
Ryo HARADA Yukio MITSUYAMA Masanori HASHIMOTO Takao ONOYE
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Online ISSN: 1745-1337
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
soft error, single event transient (SET), pulse width, measurement circuit,
Full Text: PDF(675KB)>>
This paper presents two circuits to measure pulse width distribution of single event transients (SETs). We first review requirements for SET measurement in accelerated neutron radiation test and point out problems of previous works, in terms of time resolution, time/area efficiency for obtaining large samples and certainty in absolute values of pulse width. We then devise two measurement circuits and a pulse generator circuit that satisfy all the requirements and attain sub-FO1-inverter-delay resolution, and propose a measurement procedure for assuring the absolute width values. Operation of one of the proposed circuits was confirmed by a radiation experiment of alpha particles with a fabricated test chip.