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Capacitance Extraction of Multiconductor Striplines with Finite Thickness
Hyun Ho PARK
IEICE TRANSACTIONS on Communications
Publication Date: 2009/08/01
Online ISSN: 1745-1345
Print ISSN: 0916-8516
Type of Manuscript: LETTER
Category: Electromagnetic Compatibility(EMC)
multiconductor, striplines, capacitance, Fourier transform, mode-matching technique,
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This paper presents the analysis of multiconductor striplines with a finite strip thickness using the Fourier transform and mode-matching technique. The formulations, based on quasi-static approach, are developed to obtain simultaneous equations for the modal coefficients of the potential distributions between striplines. The residue calculus is applied to represent the potential distributions in convergent series form. The closed-form expressions for the self and mutual capacitances are developed analytically. Numerical computations are performed and their results show a good agreement with those of other methods.