Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data

Zheng-Liang HUANG  Fa-Xin YU  Shu-Ting ZHANG  Hao LUO  Ping-Hui WANG  Yao ZHENG  

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E92-A   No.9   pp.2376-2379
Publication Date: 2009/09/01
Online ISSN: 1745-1337
DOI: 10.1587/transfun.E92.A.2376
Print ISSN: 0916-8508
Type of Manuscript: LETTER
Category: Reliability, Maintainability and Safety Analysis
MMICs,  reliability,  failure,  accelerated testing,  Weibull distribution,  lognormal distribution,  

Full Text: PDF>>
Buy this Article

GaAs MMICs (Monolithic Microwave Integrated Circuits) reliability is a critical part of the overall reliability of the thermal solution in semiconductor devices. With MMICs reliability improved, GaAs MMICs failure rates will reach levels which are impractical to measure with conventional methods in the near future. This letter proposes a methodology to predict the GaAs MMICs reliability by combining empirical and statistical methods based on zero-failure GaAs MMICs life testing data. Besides, we investigate the effect of accelerated factors on MMICs degradation and make a comparison between the Weibull and lognormal distributions. The method has been used in the reliability evaluation of GaAs MMICs successfully.