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Post-BIST Fault Diagnosis for Multiple Faults
Hiroshi TAKAHASHI Yoshinobu HIGAMI Shuhei KADOYAMA Yuzo TAKAMATSU Koji YAMAZAKI Takashi AIKYO Yasuo SATO
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: Special Section LETTER (Special Section on Test and Verification of VLSIs)
post-BIST fault diagnosis, multiple stuck-at faults, combinational circuits, pass/fail information,
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With the increasing complexity of LSI, Built-In Self Test (BIST) is a promising technique for production testing. We herein propose a method for diagnosing multiple stuck-at faults based on the compressed responses from BIST. We refer to fault diagnosis based on the ambiguous test pattern set obtained by the compressed responses of BIST as post-BIST fault diagnosis . In the present paper, we propose an effective method by which to perform post-BIST fault diagnosis for multiple stuck-at faults. The efficiency of the success ratio and the feasibility of diagnosing large circuits are discussed.