On Detection of Bridge Defects with Stuck-at Tests

Kohei MIYASE  Kenta TERASHIMA  Xiaoqing WEN  Seiji KAJIHARA  Sudhakar M. REDDY  

IEICE TRANSACTIONS on Information and Systems   Vol.E91-D   No.3   pp.683-689
Publication Date: 2008/03/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e91-d.3.683
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
defect based testing,  test vector generation,  test vector modification,  bridging faults,  fault extraction,  

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If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. In this paper we propose a method to detect bridge defects with a test set initially generated for stuck-at faults in a full scan sequential circuit. The proposed method doesn't add new test vectors to the test set but modifies test vectors. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND-type, OR-type and 4-way bridging faults, respectively. Experimental results show that the proposed method increases the defect coverage.