A Novel Per-Test Fault Diagnosis Method Based on the Extended X-Fault Model for Deep-Submicron LSI Circuits

Yuta YAMATO  Yusuke NAKAMURA  Kohei MIYASE  Xiaoqing WEN  Seiji KAJIHARA  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E91-D   No.3   pp.667-674
Publication Date: 2008/03/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e91-d.3.667
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
fault diagnosis,  X-fault model,  per-test,  via,  

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Summary: 
Per-test diagnosis based on the X-fault model is an effective approach for a circuit with physical defects of non-deterministic logic behavior. However, the extensive use of vias and buffers in a deep-submicron circuit and the unpredictable order relation among threshold voltages at the fanout branches of a gate have not been fully addressed by conventional per-test X-fault diagnosis. To take these factors into consideration, this paper proposes an improved per-test X-fault diagnosis method, featuring (1) an extended X-fault model to handle vias and buffers and (2) the use of occurrence probabilities of logic behaviors for a physical defect to handle the unpredictable relation among threshold voltages. Experimental results show the effectiveness of the proposed method.