A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information


IEICE TRANSACTIONS on Information and Systems   Vol.E91-D    No.3    pp.661-666
Publication Date: 2008/03/01
Online ISSN: 1745-1361
DOI: 10.1093/ietisy/e91-d.3.661
Print ISSN: 0916-8532
Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
fault diagnosis,  open fault,  BIST,  pass/fail information,  

Full Text: PDF>>
Buy this Article

In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases.