Micro-Structural Study of Fretting Contact Caused by the Difference of the Tin Plating Thickness

Tetsuya ITO  Shigeru SAWADA  Yasuhiro HATTORI  Yasushi SAITOH  Terutaka TAMAI  Kazuo IIDA  

Publication
IEICE TRANSACTIONS on Electronics   Vol.E91-C   No.8   pp.1199-1205
Publication Date: 2008/08/01
Online ISSN: 1745-1353
DOI: 10.1093/ietele/e91-c.8.1199
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electromechanical Devices(Selected Papers from IS-EMD2007))
Category: Contact Phenomena
Keyword: 
fretting corrosion,  microstructure,  tin thickness,  electric contact,  

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Summary: 
In recent years, there has been increasing demand to miniaturize wiring harness connectors in automobiles due to the increasing volume of electronic equipment and the reduction of the installation space allocated for the electronic equipment in automobiles for the comfort of the passengers. With this demand, contact failure caused by the fretting corrosion is expected to become a serious problem. In this report, we examined micro-structural observations of fretting contacts of two different tin plating thicknesses using Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) and so on. Based on the results, we compared the microstructure difference of fretting contact caused by the difference of the tin plating thickness.