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Optical Fiber Line Testing System Employing 1.65 µm Test Light Bypass Module for In-Service Monitoring of ADM Ring Networks
Yoshitaka ENOMOTO Hisashi IZUMITA Nobuo TOMITA
IEICE TRANSACTIONS on Communications
Publication Date: 2008/08/01
Online ISSN: 1745-1345
Print ISSN: 0916-8516
Type of Manuscript: Special Section PAPER (Special Section on Next Generation Broadband Access Technologies)
OTDR, ADM, optical testing, optical fiber, maintenance,
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This paper describes a novel optical fiber line testing system operating at 1.65 µm using test light bypass modules. We show a new testing configuration for add/drop multiplexer (ADM) ring networks. The test light bypass modules were installed in individual customer buildings so the test light can bypass the ADMs. We evaluated the bit-error performance with a 2.48832 Gbit/s ADM ring network using a prototype test light bypass module. We confirmed that this testing system can monitor the optical fiber cables of an ADM ring network, and that it causes no degradation in transmission quality. We show the operating area provided by the system dynamic range expressed in terms of fiber length and customer building number. The prototype system could monitor an ADM ring network linking five buildings with a 5 km loop. We also performed an in-service monitoring field trial in a 2.6 km ring network with three ADM nodes. This testing system enables us to reduce the operating, administration, and maintenance cost and improves the transmission quality of ADM ring networks.